X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

Amorphous Semiconductors
Disordered Semiconductors
Nanoparticles in Semiconductors
Optical Properties of Semiconductors
Porous Semiconductors
Structural Properties of Semiconductors
Vibrational Anisotropy
Vibrational Properties of Semiconductors
X-ray Absorption Spectroscopy
XAS Book

• Front Matter
• Introduction to X-Ray Absorption Spectroscopy
• Crystalline Semiconductors
  Front Matter
• Binary and Ternary Random Alloys
• Wide Band Gap Materials
• Dopants
• Complexes and Clusters
• Vibrational Anisotropy
• Disordered Semiconductors
  Front Matter
• Amorphous Group IV Semiconductors
• Amorphous Group III–V Semiconductors
• Semiconductors Under Extreme Conditions
• Semiconductor Nanostructures
  Front Matter
• Group IV Quantum Dots and Nanoparticles
• Group IV Nanowires
• Group III–V and II–VI Quantum Dots and Nanoparticles
• Group III–V and II–VI Nanowires
• Magnetic Semiconductors
  Front Matter
• Magnetic Ions in Group IV Semiconductors
• Magnetic Ions in Group III–V Semiconductors

Friedrich-Schiller-University Jena Institute of Solid State Physics, Jena, Germany
Claudia S. Schnohr

Department of Electronic Materials Engineering, The Australian National University, Canberra, Australia
Mark C. Ridgway

Book Title
X-Ray Absorption Spectroscopy of Semiconductors

Editors
Claudia S. Schnohr, Mark C. Ridgway

DOI
https://doi.org/10.1007/978-3-662-44362-0

Hardcover ISBN
978-3-662-44361-3
Published: 17 November 2014

Softcover ISBN
978-3-662-52212-7
Published: 23 August 2016

eBook ISBN
978-3-662-44362-0
Published: 05 November 2014

Series ISSN
0342-4111

Series E-ISSN
1556-1534

Edition Number
1

Number of Pages
XVI, 361

Number of Illustrations
99 b/w illustrations, 86 illustrations in colour

Topics
Semiconductors, Optical and Electronic Materials, Spectroscopy and Microscopy, Characterization and Evaluation of Materials, Applied and Technical Physics, Classical Electrodynamics