New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism – indispensable for such analyses – is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.

X-ray
carbon
classification
crystal
distribution
electron
mineral
scattering
water

• Front Matter
• Overall Description of Imperfect Lamellar Crystals
• Theory of the Diffraction Phenomenon Produced by Powders of Microcrystals with a Lamellar Structure
• Diffraction from Lamellar Crystals with Stacking Faults
• Statistical Models and Parameters Used to Describe Interstratified Lamellar Systems
• Diffraction Methods Adapted to the Structural Analysis of Interstratified Systems
• Experimental Techniques Adapted to the Study of Microdivided Lamellar Systems
• Structural Characteristics of Carbons
• The Modelization Method in the Determination of the Structural Characteristics of Some Layer Silicates: Internal Structure of the Layers, Nature and Distribution of the Stacking Faults
• Determination of the Structural Characteristics of Mixed-Layer Minerals
• Back Matter

Geological Institute, Academy of Sciences, Moscow, USSR
Victor A. Drits
Laboratoire de Cristallographie (associé au CNRS), Université d’Orléans, Orléans Cedex, France
Cyril Tchoubar

Book Title
X-Ray Diffraction by Disordered Lamellar Structures

Book Subtitle
Theory and Applications to Microdivided Silicates and Carbons

Authors
Victor A. Drits, Cyril Tchoubar

DOI
https://doi.org/10.1007/978-3-642-74802-8

Softcover ISBN
978-3-642-74804-2
Published: 13 December 2011

eBook ISBN
978-3-642-74802-8
Published: 06 December 2012

Edition Number
1

Number of Pages
XVII, 371

Topics
Mineralogy, Crystallography and Scattering Methods, Inorganic Chemistry