This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

artificial intelligence
authentication
cryptography
data security
energy efficiency
Field Programmable Gate Array (FPGA)
FPGA
hardware
image processing
integrated circuit layout
integrated circuit testing
logic gates
microprocessor chips
signal processing
telecommunication networks
telecommunication traffic
vlsi circuits
wireless networks
wireless sensor networks
wireless telecommunication systems

• Introduction to VLSI Design
• MOS Transistor Theory
• CMOS Technology and Fabrication
• CMOS Inverter and Logic Gates
• Combinational Circuit Design
• Sequential Circuit Design
• CMOS Layout and Design Rules
• Subsystem Design and Building Blocks
• Timing Analysis and Clocking Strategies
• Low Power VLSI Design
• Design for Testability (DFT)
• Testing of Digital Circuits
• Fault Modeling and Simulation
• Test Pattern Generation
• Built-In Self-Test (BIST)
• Scan-Based Testing
• Memory Testing
• Delay Fault Testing
• DFT in Modern VLSI Systems
• VLSI Design Tools and Methodologies
• Physical Design Automation

Computer Science and Engineering, Indian Institute of Technology Indore, Indore, India
Anirban Sengupta

Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, India
Sudeb Dasgupta

Department of Electrical Engineering, Indian Institute of Technology Bombay, Mumbai, India
Virendra Singh

Department of Electrical Engineering, Indian Institute of Technology Ropar, Rupnagar, India
Rohit Sharma

Electrical Engineering, Indian Institute of Technology Indore, Indore, India
Santosh Kumar Vishvakarma

Book Title
VLSI Design and Test

Book Subtitle
23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers

Editors
Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma

Series Title
Communications in Computer and Information Science

DOI
https://doi.org/10.1007/978-981-32-9767-8

Softcover ISBN
978-981-32-9766-1
Published: 18 August 2019

eBook ISBN
978-981-32-9767-8
Published: 17 August 2019

Series ISSN
1865-0929

Series E-ISSN
1865-0937

Edition Number
1

Number of Pages
XVI, 775

Number of Illustrations
209 b/w illustrations, 336 illustrations in colour

Topics
Computer Hardware, Computer Systems Organization and Communication Networks, Artificial Intelligence, Systems and Data Security, Image Processing and Computer Vision, Mathematical Logic and Formal Languages