Editors:Yoshio Waseda , Eiichiro Matsubara , Kozo Shinoda
Paperback ISBN:978-3-642-44255-1
eBook ISBN:978-3-642-16635-8
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Crystallographic structure analysis
Crystallography of powders
Problem solver X-ray diffraction analysis
Properties of X-rays
Structural analysis
Tutorial-like monograph on X-ray analysis
X-ray diffraction
Inst. Multidisciplinary Research for, Advanced Materials, Tohoku University, Sendai, Japan
Yoshio Waseda, Kozo Shinoda
Graduate School of Engineering, Dept. Materials Science & Engineering, Kyoto University, Kyoto, Japan
Eiichiro Matsubara
Book Title
X-Ray Diffraction Crystallography
Book Subtitle
Introduction, Examples and Solved Problems
Authors
Yoshio Waseda, Eiichiro Matsubara, Kozo Shinoda
DOI
https://doi.org/10.1007/978-3-642-16635-8
Hardcover ISBN
978-3-642-16634-1
Published: 09 March 2011
Softcover ISBN
978-3-642-44255-1
Published: 21 November 2014
eBook ISBN
978-3-642-16635-8
Published: 18 March 2011
Edition Number
1
Number of Pages
XI, 310
Topics
Characterization and Evaluation of Materials, Crystallography and Scattering Methods, Nanotechnology and Microengineering, Solid State Physics, Spectroscopy and Microscopy
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